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Power metallization degradation monitoring on power MOSFETs by means of concurrent degradation processes
Sergio De Gasperi Michael Nelhiebel Dieter Haerle Andrea Baschirotto
Vol. 22, No. 9, pp. 1587-1595, Sep. 2022
10.1007/s43236-022-00463-5
Vol. 22, No. 9, pp. 1587-1595, Sep. 2022
10.1007/s43236-022-00463-5
ISSN : 1598 - 2092
eISSN : 2093 - 4718